Low profile leaded semiconductor package

ABSTRACT

In a semiconductor package a lead having a bottom surface coplanar with the flat bottom surface of the plastic body extends outward at the bottom of the vertical side surface of the plastic body. The result is a package with a minimal footprint that is suitable for the technique known as “wave soldering” that is used in relatively low-cost printed circuit board assembly factories. Methods of fabricating the package are disclosed.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims the priority of Provisional Application Nos.61/775,540 and 61/775,544, filed Mar. 9, 2013, each of which isincorporated herein by reference in its entirety.

FIELD OF THE INVENTION

This invention relates to semiconductor packages including packages forpower devices and analog integrated circuits.

BACKGROUND OF THE INVENTION

Semiconductor devices and ICs are generally contained in semiconductorpackages comprising a protective coating or encapsulant to preventdamage during handling and assembly of the components during shippingand when mounting the components on printed circuit boards. For costreasons, the encapsulant is preferably made of plastic. In a liquidstate, the plastic “mold compound” is injected into a mold chamber at anelevated temperature surrounding the device and its interconnectionsbefore cooling and curing into a solid plastic. Such packages arecommonly referred to as “injection molded”.

Interconnection to the device is performed through a metallic leadframe,generally made of copper, conducting electrical current and heat fromthe semiconductor device or “die” into the printed circuit board and itssurroundings. Connections between the die and the leadframe generallycomprise conductive or insulating epoxy to mount the die onto theleadframe's “die pad”, and metallic bond wires, typically made of gold,copper, or aluminum, to connect the die's surface connections to theleadframe. Alternatively, solder balls, gold bumps, or copper pillarsmay be used to attach the topside connections of the die directly ontothe leadframe.

While the metallic leadframe acts as an electrical and thermal conductorin the finished product, during manufacturing the leadframe temporarilyholds the device elements together until the plastic hardens. After theplastic cures, the packaged die is separated or “singulated” from otherpackages also formed on the same leadframe by mechanical sawing. The sawcuts through the metal leadframe and in some instances through thehardened plastic too.

In “leaded” semiconductor packages, i.e. packages where the metallicleads or “pins” protrude beyond the plastic, the leads are then bentusing mechanical forming to set them into their final shape. Thefinished devices are then packed into tape and reels ready for assemblyonto customers' printed circuit boards (PCBs).

One example of a leaded package 1 is shown in cross section in FIG. 1A,comprising semiconductor die 4, plastic 2, bond wires 5B and 5C,metallic leads 3B and 3C, and metallic die pad 3A. The metallic leads 3Band 3C and the die pad 3A comprise elements from a single lead frameseparated during manufacturing. Leads 3B and 3C along with other leadsnot visible in the cross section are bent to lie flat or “coplanar” on aPCB depicted by planar surface 6. Owing to the shape of the bent leads3B and 3C, package 1 is sometimes referred to as a “gull-wing” package.

Such leaded packages are manufactured in a large variety of sizes andpin configurations ranging from 3 leads used for packaging transistorsand simple ICs such as bipolar junction transistors, power MOSFETs andshunt voltage regulators, to dozens of leads used for packagingintegrated circuits (ICs). To date many billions of products have beenmanufactured using injection-molded leaded plastic packages. Commonpackages include small transistor packages like the SC70 and SOT23packages, small outline packages such as the SOP-8, SOP-16 or SOP-24,and for higher pin counts, the leaded quad flat pack or LQFP. The LQFP,which can have 64 or more leads per package, apportions its leads ineven amounts on each of its four edges while SOT and SOP packages haveleads positioned on only two sides.

To accommodate the lead bending process, minimum package heights for theSOP and LQFP typically exceed 1.8 mm. Some packages including the smalloutline transistor package such as the SOT23-3, SOT23-5, SOT23-6 and theSOT223, the small chip package such as the SC70, the TSOP-8 thin smalloutline package, and the TSSOP-8 thin super small outline package havebeen engineered for lower profiles, as thin as 1 mm. Below 1 mmthickness it becomes difficult to manufacture any of these packages.Even for greater package heights, maintaining good lead coplanarityduring lead bending is a constant concern in the volume manufacturing ofgull wing packages.

Accurate forming of leads to tight specifications and tolerances isproblematic. Customers consider deformed leads as quality failures,demanding a formal corrective action response and a committedimprovement schedule. In extreme cases, manufacturing outside ofspecified tolerances can result in manufacturing interruptionstriggering financial penalties, vendor disqualifications and evenlitigation.

Poor control of lead bending in manufacturing is not the only limitationof these packages. Despite their ubiquity, leaded injection moldedpackages suffer from a number of other limitations including poor areaefficiency, poor thermal resistance and a relatively thickcross-sectional profile. Specifically, the maximum die size of suchpackages is small compared to their footprint on a printed circuitboard, in part because of the area wasted by the curved portion of theleads. Comparing the maximum die area to the PCB mounting area of thepackage, area efficiency of gull wing packages can be as low as 30% to50%.

One way to improve the area efficiency is to bend the leads under thepackage as shown in the package 11 of FIG. 1B comprising semiconductordie 14, plastic body 12, bond wires 15B and 15C, metallic leads 13B and13C, and metallic die pad 13A. The metallic leads 13B and 13C and diepad 13A comprise elements from a single lead frame separated duringmanufacturing. Leads 13B and 13C along with other leads not visible inthe cross section are bent under the package to lie flat or “coplanar”on a PCB depicted by imaginary surface 16. The lead shape can bereferred to as a “J” lead for its obvious resemblance to the alphabeticcharacter, but in practice is more similar to the gull-wing shape in theinverse direction.

Unlike gull wing package 1, the improved package 11 is able toaccommodate a wider plastic body 12 and a larger cavity for die 14 forany given PCB footprint and likewise support a significantly larger die14, up to three times the die size of gull wing packages with the samefootprint, with area efficiencies improving up to 70% or even 80%.Accordingly this package type is referred to as a JW type package, areference to its J-lead widebody construction. Production volumes todate exceed 1 billion units including the SC70JW, a JW-type packagehaving the same PCB footprint as the SC70, and the TSOPJW, a smallerJW-type package having the same PCB footprint as the TSOP package.

Unfortunately the process of lead bending requires both vertical andhorizontal clearance for the lead-forming machine to secure and bend theleads without touching the plastic. Should the machine touch theplastic, the plastic may crack and the resulting product will not passrequisite reliability and hermeticity tests. In order to avoid damageand achieve a lower package profile, the bottom edges of plastic body 12of JW package 11 are notched to accommodate the upward bend of leads 13Band 13C. Even with this notch, considering minimum tolerances for thebending process, the JW package cannot be reliably manufactured below athickness of 1 mm. Practically speaking, manufacturing any JW package involume under 1.1 mm of thickness is challenging.

Aside from their height limitations, gull wing and JW type packages lackeffective heat sinking because it is difficult to integrate an exposeddie pad as a heat slug into these packages. In low thermal resistance“power packages” a heat slug comprising solid copper is interposedbetween the die and the PCB, essentially by employing a thick die padwhose backside extends beyond the plastic package. For example, in thepackage of FIG. 1A, if die pad 3A extended beyond plastic 2 down toplanar surface 6, as shown hypothetically by metallic heat slug 7, heatcould be more effectively transported from the die into the PCB. Inpractice heat slug 7 would replace die pad 3A, serving the dual roles ofdie pad and heat slug. As such, heat slug 7 can also be referred to asan “exposed die pad.”

The problem with heat slug 7 is leads 3B and 3C have to be bent to matchthe bottom of heat slug 7. Unfortunately, the backside of heat slug 7 isnot naturally coplanar with its leads 3B and 3C. While the formingmachine can be calibrated to keep leads 3B and 3C relatively coplanarwith one another, the distance of the bent foot below the bottom ofplastic enclosure 2 will vary and so misalign leads 3B and 3C with thebottom hypothetical heat slug 7. While this misalignment can betolerated in low volume production, yield fluctuations resulting fromnatural stochastic variability of a manufacturing process run in highvolume are unavoidable, their impact being both risky and potentiallyvery costly.

Moreover, such stochastic variability may result in differing failuremodes in an application. For example, statistically, in some cases thebottoms of leads 3B and 3C may extend below the bottom of heat slug 7.In such cases mounting package 1 on a PCB having a top surface 6 willresult in electrical connections to leads 3B and 3C, but with the bottomheat slug 7 suspended above plane 6 and unable to conduct heat into thePCB. Conversely, when heat slug 7 extends below the bottoms of leads 3Band 3C, then the leads may not solder onto the PCB whatsoever, resultingin open circuits and defective PCBs. Worse yet, poor or “cold” solderjoints may result, passing final manufacturing tests but failing duringoperation in the field. Significant field failures can result in costlyproduct recalls with the potential for customer damage claims againstthe manufacturer.

Despite all its manufacturing risks, leaded gull wing package 1 of FIG.1A is at least conceptually adaptable to accommodate heat slug 7,because the package utilizes a “die up” design, where die 4 sits atopdie pad 3A or hypothetical heat slug 7. In contrast, JW-type package 11of FIG. 1B is completely incompatible with a PCB connected heat slugbecause the package utilizes a “die down” configuration, one where die14 sits beneath die pad 13A.

To avoid the variability of lead bending in order to make a low profilepackage, a completely different type of package, a “leadless” package,was developed and became commercially adopted circa 2000. One commonnomenclature for this type of package having leads on all four of itsedges is the QFN, an acronym for quad flat no-lead package. A two-sidevariant of the package, the DFN or dual flat no-lead package is alsowidely used today. The nominative “leadless” or “no-lead” does not meanthe package lacks connections to the PCB, but that its leads do notprotrude beyond the edges of the plastic on any side. The term flatimplies the package height is uniform, lacking an area devoted to bentleads.

Such a leadless package 21 is illustrated in the cross-sectional view ofFIG. 2A comprises semiconductor die 24, plastic body 22, bond wires 25Band 25C, metallic leads 23B and 23C, and metallic die pad 23A. Themetallic leads 23B and 23C and die pad 23A comprise elements from asingle lead frame, collectively referred to as 23, whereby the leadframeis separated into die pad 23A, leads 23B and 23C, and into other leads(not shown) during manufacturing. As shown the lateral extent of plastic22 and metallic lead 23C are coplanar with vertical edge 31 such thatlead 23C does not extend beyond the edge of plastic body 22. In asimilar manner lead 23B is coplanar with the other vertical edge ofplastic body 22. Because the leads are vertically oriented, no clearanceis required for leads or for lead bending and area efficiencies improve,in some cases up to 80% to 90% PCB area utilization.

The bottom of leadless package 21 is also flat, with the bottom ofplastic body 22 coplanar with the bottoms of leads 23B and 23C alonghorizontal planar edge 26. In the event that optional heat slug 32replaces die pad 23A, the bottom of optional heat slug 32 is naturallycoplanar with the bottoms of leads 23B and 23C shown by horizontal line26 because leads 23B and 23C and heat slug 32 are all formed out of thesame piece of metal.

As shown in the DFN perspective drawing of FIG. 2B, leads 23B, 23D, 23Fand 23H do not protrude beyond the cube shape defined by plastic body22, lying flush with the side face of the package and with the bottomedge defined by horizontal line 26. A plan view of the packageunderside, shown in FIG. 2C, confirms the coplanarity of leads 23Bthrough 23I with all the edges defined by plastic body 22. The optionalheat slug 32 is also naturally coplanar with the bottom of the packageand laterally enclosed on all side by a surrounding donut of plasticbody 22.

Mounting of a leadless package onto a PCB requires solder between thepackage and the board, accomplished by coating the PCB with a solderpaste prior to component placement. After a pick and place machineplaces all the components onto the PCB, the PCB is run through a reflowfurnace, typically on a movable belt. During the reflow operation, thesolder paste melts and adheres only to portions of the PCB where thecopper traces are exposed. Likewise the solder only adheres to theexposed metallic surfaces of the mounted components. Accordingly, anyPCB assembly manufacturing using solder reflow to attach components isreferred to in the industry vernacular as a “reflow” assembly line.

A cross-sectional view of such a PCB assembly is shown in FIG. 2D whereDFN package 21 is mounted onto multilayer PCB 27 by solder 30. Asillustrated, DFN package 21 comprises, in part, a lead 23B and a plasticbody 22. PCB 27 comprises an insulating substrate 28, typicallyphenolic, and multiple layers of conductive traces 29, 34 and 35,typically comprising copper. Some portions, but not all, of theconductive traces are exposed on the surface. An even smaller portion ofconductive traces 29 overlap the conductive leads of the mountedcomponents, in this case lead 23B and optionally heat slug 32.

The solder paste applied to the PCB prior to component mountingtypically involves a metal such as Ag or a binary metallic compound suchas Pb—Sn that melts at a relatively low temperature. In recent years, Pbcompounds have largely been banned for environmental concerns, withhigher temperature silver (Ag) solder being used instead. In the reflowassembly process, because the package is placed atop the solder itself,there is no need for solder to be able to flow under the package leads.

During the reflow process solder 30 reflows to where both PCB 27 has anexposed conductive trace 29 and DFN package 21 has an exposed lead 23B.The package itself is held in place purely by surface tension. Thesolder naturally “flows” away from any area lacking metallic connectionson both package 21 and multilayer PCB 27. In essence, the solder goes towhere it is needed, i.e. to the solder joint, and after reflow solder isabsent from all other portions of the PCB. In cases where optional heatslug 32 is present, solder 33 will also remain in this region.

Ideally, after reflow, solder 30 fills the entire cavity between thebottom of lead 23B and conductive trace 29. In some cases solder 30 will“wick” up onto the side of lead 23B through the fluidic behavior toreduce surface tension. The connection to the side of lead 23B isinconsistent and cannot be relied on to insure a good connection.Instead, the solder located in the region directly between the bottom oflead 23B and conductor 29 must facilitate the main electrical andmechanical connection of the mounted component. In the case whereoptional heat slug 32 is present, solder will ideally fill the entirecavity between the bottom of heat slug 32 and the top of PCB conductivetrace 34.

If any of these intervening regions are not filled with solder 30, anundesirable void will result, weakening the mechanical strength of thesolder joint, increasing the electrical resistance of the connection,and possibly compromising the reliability of the product. For example,solder joints with large voids mechanical weaken in bond strengththrough repeated contractions and expansions during thermal cycling orpower cycling. Eventually, a crack will form in the solder, and thecomponent will develop and open or intermittent electrical connection.In extreme cases the component may “fall off” the PCB altogether.

So it is critical to confirm that a void free solder joint is formed onevery lead during manufacturing. Since, however, the main solderconnection is “beneath” the component, visual inspection is notpossible, so that expensive x-ray inspection equipment is required.

PCB assembly using the described reflow method is commonly available inmodern multilayer PCB factories used for manufacturing smartphones,tablets, notebooks, servers, and network infrastructure. Such productstypically command sufficiently high prices to afford the highermanufacturing cost of a multilayer PCB assembly facility. Some markets,however, are extremely cost sensitive and cannot afford the high cost ofmultilayer PCBs or reflow PCB assembly with x-ray inspection. Instead,the cost sensitive products are still manufactured in PCB facilitiesbuilt in the 1960s and using fully depreciated equipment.

Examples of products demanding low cost PCB assembly include mostconsumer products including clocks, radios, televisions, and homeappliances along with many power supply modules used in consumer,lighting, HVAC (heating, ventilation and air conditioning) andindustrial applications. These old PCB factories are incapable of reflowsolder manufacturing, lack x-ray inspection equipment, and canaccommodate only one- or at most two-sided PCBs, i.e. PCBs with only oneor two conductive layers. In fact the cost of a multilayer PCBmanufactured with reflow processing can be 2 to 5 times that ofsingle-layer PCBs made in these older factories.

To attach the components to the PCB, these low-cost factories use amethod known as “wave soldering”, essentially immersing the board andits components with molten solder that sticks only where a solder jointis to be made, i.e. where the component and the PCB both have exposedmetallic surfaces in close proximity. In practice the components are“glued” down in their proper place and then the PCB is dipped in amolten solder bath. Because the solder is applied after the component ismounted, no solder is present between the bottom of a package lead andthe PCB conductive trace as it is in FIG. 2D. Instead the solderattaches itself to the sides of the leads and wicks its way up onto thelead. In order to make a good connection the solder must cover asignificant portion of any component's exposed leads. Because the solderis present on the exposed leads, the soldering operation can beinspected visually without the need for expensive x-ray inspectionequipment. For this reason, only leaded packages such as the gull wingand JW-type packages shown in FIG. 1A and FIG. 1B are used withwave-solder PCB assembly.

Despite their performance advantages, leadless packages areintrinsically incompatible with wave soldering and low cost PCBassembly. As described previously, in wave soldering there is no meansby which solder can squeeze between the bottom of the package leads andthe PCB conductive traces, since those areas are filled with glue.Likewise, the vertical edges of the exposed leads 23B and 23C of theleadless package 21 shown in FIG. 2A are not suitable for wave-solderassembly because the solder will not reliably wick its way onto avertical exposed lead, in essence because it is too steeply inclined.Also, as a vertical edge, it is impractical to visually inspect soldercoverage of the lead.

Unfortunately, the angle of the side of a leadless package isnecessarily vertical because of the way in which it is manufactured.FIG. 3 illustrates a leadless package during manufacturing after plasticmolding but before singulation. As before, leadless package 21 comprisesdie pad 23A, die 24, bond wires 25B and 25C and leads 23B and 23Cencapsulated in a plastic body 22. To the right of package 21 is anidentical package manufactured with the same leadframe. As shown, lead23C actually is a solid piece of metal extending into the next package.

The region labeled “saw blade” describes where the saw cuts during diesingulation. During sawing, it cuts through plastic 22 and ultimatelythrough lead 23C separating package 21 from its neighbors. Because theedge of package 21 is defined by a sawing operation, the edge of the sawblade 31 is necessarily substantially vertical. The coplanarity of lead23C and the remaining plastic body 22 is a natural result of the factthat edge 31 is defined by the saw blade's cut. No practical way existsto slope the cut line of the saw blade, so edge 31 is necessarilyvertical. As a result, all leadless packages today lack the ability tobe assembled using low cost wave solder PCB factories.

In conclusion, leaded packages such as the gull wing, JW-type, and LQFPplastic packages are compatible with low cost wave-solder PCB assemblyand visual inspection, but suffer from a high package height, problemswith maintaining precise coplanarity of the leads during the bendingprocess, poor area efficiency, and an inability to incorporate a heatslug for improved power dissipation. Leadless packages like the DFN andQFN offer superior coplanarity, high area efficiency, and the ability toincorporate a heat slug for improved power dissipating capability, butare incompatible with low cost PCB assembly using wave-soldering andvisual inspection, instead requiring more expensive solder reflow PCBmanufacturing with x-ray inspection.

What is needed is a new package that offers the performance andcoplanarity benefits of the leadless package but is compatible with thelow-cost PCB assembly method that uses wave soldering and visualinspection.

SUMMARY OF THE INVENTION

A package of this invention comprises a semiconductor die, a die pad, alead and a plastic body. The die pad may be completely encased in theplastic body or exposed at the bottom surface of the plastic body. Thelead is generally Z-shaped when viewed in a vertical cross section andcomprises a vertical column segment, a cantilever segment and a foot.The cantilever segment projects horizontally inward towards the die padat the top of the vertical column segment, and the foot projectshorizontally outward at the bottom of the vertical column segment. Thevertical column segment typically forms right angles and sharp cornerswith the cantilever segment and with the foot. The bottom surface of thefoot is coplanar with a bottom surface of the plastic body.

In some embodiments, the vertical column segment extends horizontallybeyond a side surface of the plastic body to form a ledge. In otherembodiments, the side surface of the plastic body extends outward beyondthe vertical column segment and covers a portion of the upper surface ofthe foot. All or a portion of the upper surface of the foot is exposed.

The package of this invention uniquely combines the characteristics of aleaded package, shown in FIGS. 1A and 1B, with those of a leadlesspackage, shown in FIGS. 2A and 2B. Thus the vertical edge of thevertical column segment forms a vertical plane and is either covered byor located slightly outside the plastic body. In embodiments wherein thevertical outside edge of the vertical column segment is covered by theplastic body, the foot protrudes outward at the bottom of the sidesurface of the plastic body. A bottom surface of the foot is flat atleast from a location adjacent to the side surface of the plastic bodyto the end of the foot. These features minimize the horizontaldimensions of the package.

The invention also comprises a process for forming a semiconductorpackage. The process comprises forming a first mask layer on a firstside of a metal piece and then partially etching the metal piece throughan opening in the first mask layer in an area where the die pad, thecantilever segment of the lead and a gap between the lead and the diepad are to be located. If the die pad is to be exposed at the bottom ofthe plastic body, the mask layer also covers where the die pad is to belocated, and that area is not etched. The partial etch does not cutthrough the entire metal piece, and a thinned layer of metal remains inthe etched areas.

The process further comprises forming a second mask layer on a secondside of the metal piece, second mask layer having first and secondopenings, the first opening in the second mask layer overlying the gapbetween the die pad and the lead, the second opening in the second masklayer overlying an area where the foot of the lead is to be located. Ifmultiple packages are to be formed from the metal piece, the secondopening in the second mask layer may also overlie an area separatingadjacent packages.

The metal piece is then etched through the first and second openings inthe second mask layer. This etch is continued until the metal iscompletely removed in the area where the gap between the die pad and thelead is to be located but is only partially removed in the area wherethe foot is to be located (and in the area separating adjacentpackages). The first opening in first mask layer and the second openingin the second mask are vertically offset from each other such than asection of the metal piece remains unaffected by the etch processes.That section will become the vertical column segment of the lead.

Alternatively, a metal stamping process may be used in lieu of the etchprocesses described above. A first metal stamp is applied to the firstside of the metal piece to compress and thin the metal piece where thecantilever segment of the lead and the gap between the die pad and thelead are to be located (and optionally where the die pad is to belocated). A second metal stamp is applied to the second side of themetal piece to sever the metal piece where the gap between the die padand the lead is to be located and to compress and thin the metal piecewhere the foot of the lead is to be located (and optionally in the areabetween adjacent packages).

Whether an etching or stamping processes is used, the result istypically a leadframe with multiple die pads, each die pad beingassociated with a plurality of leads. If the package is to have leadsonly on two opposite sides of the die pad (a “dual” package), the diepad is typically held in place in the leadframe by means of at least onetie bar. If the package is to have leads on four sides of the die pad (a“quad” package), the die pad is typically left connected to at least oneof the associated leads, that is, no gap is formed between the die padand the at least one of the associated leads in the above-describedetching or stamping processes. Either way, the die pad remains connectedto the leadframe.

A semiconductor die is then mounted to the die pad, and an electricalconnection is made between the die and the lead, typically using wirebonding or flip-chip techniques. The die, die pad and a portion of thelead are encased in a plastic molding compound that is cured to form aplastic body, the plastic body leaving at least a portion of the foot ofthe lead uncovered. In some embodiments, the plastic body does not coverthe vertical outside surface of the vertical column segment, forming aledge at the top of the lead.

The leadframe and dice are then singulated into separate packages. Inthe case of dual packages, the leadframe is first cut, typically bysawing, so as to separate adjacent packages on the sides where the leadsare located. The first cut is made so as to leave a segment of each leadprotruding beyond its vertical column segment, the protruding segmentforming the foot of the lead. The plastic body is not affected by thiscut. The packages are then separated by cutting them apart on the sideswhich do not have leads. This second cut, which is typically made at aright angle to the first cut, cuts through the plastic body and normallya tie bar that holds the die pad in place before the molding process iscompleted.

In the case of quad packages, two cuts are also made, typically at rightangles to each other, but both cuts are similar to the first cutdescribed above, that is, the plastic body is not affected and a foot ofeach lead is left protruding beyond its vertical column segment.

The invention will be more fully understood by reference to thefollowing drawings and detailed description.

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings listed below, components that are generally similar aregiven like reference numerals.

FIG. 1A is a cross-sectional view of a leaded gull-wing package.

FIG. 1B is a cross-sectional view of a leaded JW-type package.

FIG. 2A is a cross-sectional view of a leadless package.

FIG. 2B is a perspective view of a leadless package.

FIG. 2C is a bottom view of a leadless package.

FIG. 2D is a cross-sectional view of a leadless package mounted on a PCBusing solder reflow.

FIG. 3 is a cross-sectional view of leadless packages beforesingulation.

FIG. 4 is a cross-sectional view of a low-profile footed package made inaccordance with this invention.

FIG. 5A is a cross-sectional view of a leadframe prior to manufacturingillustrating the locations of the elements to be formed.

FIG. 5B is a cross-sectional view of a leadframe after the first maskprocess step and prior to the first metal etch.

FIG. 5C is a cross-sectional view of the leadframe after the second maskprocess step and prior to the second metal etch.

FIG. 5D is a cross-sectional view of the leadframe after the secondmetal etch and mask removal process steps.

FIG. 5E is a cross-sectional view of the leadframe after the die-attachand wire-bonding process steps.

FIG. 5F is a cross-sectional view of the leadframe after the plasticmolding process step but prior to singulation.

FIG. 5G is a cross-sectional view of the leadframe after the diesingulation process steps.

FIG. 6A is a plan view of a multi-package DFF leadframe includingsupporting bars holding adjacent packages in place.

FIG. 6B is a widthwise (x-direction) cross-sectional and correspondingplan view of a DFF footed package illustrating common features and theirrelative alignment.

FIG. 6C is a lengthwise (y-direction) cross-sectional and correspondingplan view of a DFF footed package illustrating common features and theirrelative alignment.

FIG. 6D is a comparison of the widthwise and lengthwise cross-sectionalviews of a DFF footed package illustrating the common features and theirrelative alignment.

FIG. 7A is a perspective view of an 8-lead DFF footed package.

FIG. 7B is a bottom view of a narrow body 8-lead DFF footed package.

FIG. 7C is a bottom view of a wide-body 8-lead DFF footed package.

FIG. 7D is a bottom view of an 8-lead DFF footed package with an exposeddie pad and two exposed die-pad-connected leads.

FIG. 7E is a bottom view of a 5-lead DFF footed package with a wide heattab.

FIG. 8A is a cross-sectional view of a footed package without an exposeddie pad mounted on a PCB.

FIG. 8B is a cross-sectional view of a footed package with an exposeddie pad mounted on a PCB.

FIG. 8C is a cross-sectional view of a footed package with an exposeddie pad shorted to a lead mounted on a PCB.

FIG. 9A is a cross-sectional view of an alternative footed package withan exposed die pad not attached to the package leads.

FIG. 9B is a cross-sectional view of an alternative footed package withan exposed die pad merged into the package lead.

FIG. 9C is a cross-sectional view of an alternative footed package witha non-exposed die pad attached to the package lead.

FIG. 9D is a cross-sectional view of an alternative footed package withan exposed die pad attached to the package lead internally.

FIG. 9E is across-sectional view of an alternative footed package with aT-shaped exposed die pad not attached to the package leads.

FIG. 10 is a cross-sectional view of an alternative footed package withthe leads covered by plastic.

FIG. 11A is a plan view of a multi-package QFF leadframe includingsupporting bars holding adjacent packages in place.

FIG. 11B is a bottom view of a 16-lead QFF footed package with anoptional exposed die pad.

FIG. 11C is a perspective view of 16-lead example of QFF footed package

FIG. 12A is a plan view of an alternative QFF leadframe including a wideheat tab lead.

FIG. 12B is a bottom view of an alternative QFF package including a wideheat tab lead.

FIG. 12C is a perspective view of an alternative QFF package including awide heat tab lead.

FIG. 13A is a plan view of an alternative square QFF leadframe includingdouble-sided wide heat tab leads.

FIG. 13B is a plan view of an alternative rectangular QFF leadframeincluding double-sided wide leads.

FIG. 13C is a plan view of another embodiment of a rectangularleadframe.

FIG. 14A is a cross-sectional view of a footed package showing a tie baron a flush saw edge.

FIG. 14B is a cross-sectional view of a footed package showing aproblematic tie bar protrusion on a footed edge.

FIG. 15A is a cross-sectional view of a footed package with a solderball die attach to leads.

FIG. 15B is a cross-sectional view of a footed package with a solderball die attach to leads and a die pad.

FIG. 16A is a cross-sectional view of a footed package with a solderball die attach and backside wire down bond.

FIG. 16B is a plan view of a footed package with a solder ball dieattach and backside wire down bond.

FIG. 16C is a plan view of a footed package with a heat tab, solder balldie attach and backside wire down bond.

DESCRIPTION OF THE INVENTION

FIG. 4 illustrates a low profile package 41 compatible with wavesoldering made in accordance with this invention. The package comprisesa semiconductor die 44, a die pad 43A, leads 43B and 43C, bond wires 45Band 45C, and plastic body 42. To accommodate wave soldering and visualinspection, lead 43B includes “foot” 53B protruding laterally beyondplastic body 42. In a similar fashion, lead 43C includes “foot” 53Cprotruding laterally beyond plastic body 42.

Leads 43B and 43C with corresponding feet 53B and 53C, along with diepad 43A, are constructed out of a single piece of metal, preferablycopper, without the need for bending or lead forming. As a result, thebottoms of leads 43B and 43C and feet 53B and 53C are naturally coplanarwith one another as represented by horizontal line 46. Except for asmall ledge 52 of leads 43B and 43C that extends beyond plastic body 42,the newly disclosed package is essentially leadless aside from its feet.Accordingly, packages made in accordance with this invention are hereinreferred to as flat “footed” packages, having corresponding acronyms DFFfor dual-side footed packages and QFF for quad (four-sided) footedpackages. In the context of this disclosure, the term flat refers to lowprofile, i.e. thin or low package height.

As illustrated, the vertical height of feet 53B and 53C is a fraction ofthe height of leads 43B and 43C. In a preferred embodiment, the heightof feet 53B and 53C is no more than 30% of the vertical height of leads43B and 43C. Because of the low foot height, during PCB assembly soldercan easily wick onto feet 53B and 53C, covering the metallic leadextensions in solder. Since the solder joint occurs beyond the plasticpackage body rather than beneath it, solder quality and coverage can beeasily confirmed by visual inspection, either by low costvisual-inspection machines or by the human eye.

The thermal characteristics and electrical performance of the disclosedDFF and QFF packages are similar to that of similar sized DFN and QFNpackages except for a slight detriment in area efficiency lost by theextra area needed to accommodate the feet. In manufacturing, however,the differences in conventional leadless packages and the newlydisclosed footed packages are substantial. In the conventional leadlesspackage, solder must wick itself onto the sidewall of the package'svertical leads, whereas in the footed package solder can easily flowonto the low profile feet without needing to climb onto and adhere to anessentially vertical lead. The edge of the foot can be rounded tofurther enhance solderability and lead coverage, making it even easierfor solder to cover the foot. Likewise, while it is nearly impossible tovisually inspect solder coverage on the sides of the vertical leadspresent in conventional leadless packages, the disclosed footed packagecan be easily inspected for solder coverage and quality.

While a numerous design variations and manufacturing flows are possibleto produce the footed package, one exemplary manufacturing flow is shownin cross section in FIG. 5A through FIG. 5G, starting with a solid pieceof metal piece 43 and finishing with a completed package 41.

FIG. 5A illustrates a single solid metal piece 43 forming a portion of aconductive leadframe used to fabricate multiple packaged productssimultaneously, comprising a metallic alloy or solid metal, preferablycopper, and having a thickness that depends on the desired thickness andpower rating of the package. In low-profile package applications likeportable consumer devices where package thickness is critical, metalpiece 43 must be limited in height, e.g. approximately 200 μm thick,while in higher power applications a thicker metal is needed, as a athicker metal, e.g. from approximately 500 μm to approximately 1.2 mmthick, is a better heat spreader. In some embodiments, the metal may bemore than 1.2 mm thick. The copper may be plated with another metal suchas Sn (tin) either at the beginning at the process or later inmanufacturing.

The lateral dimensions of the portion of the metal piece 43 from which asingle package will be manufactured vary with the size of the package,ranging from a fraction of a millimeter to tens of millimeters for asingle package. For illustrative purposes, the constituent packageelements into which metal piece 43 will be manufactured are shown inFIG. 5A as dotted lines, defining where die pad 43A and metallic leads43B and 43C (including feet 53B and 53C) will be formed during theprocessing in accordance with this invention.

In FIG. 5B, metal piece 43 is coated with a photoresist layer 60, whichis optically patterned using photolithographic means to define anopening 61 exposing metal piece 43. Metal piece 43 is subsequentlyetched to form a thin region 62. Alternatively, protective photoresistlayer 60 may be silkscreened through a stencil mask to define theopening 61 in photoresist layer 60. The subsequent metal etching isperformed by immersing the metal piece 43 in a heated acid bath ofsulfuric or nitric acid, or other acids commonly used to etch metal insemiconductor package manufacturing. After etching, the thin region 62may have a thickness equal to 10% to 30% of the original thickness ofmetal piece 43, but the thin region 62 is generally at least 50 μmthick.

In an alternative embodiment, a metal “stamp” is used to stamp andcompress a portion of metal piece 43 to form thin region 62. Metalstamping, a method well known to those skilled in the art of metalworking, utilizes powerful precision machinery that mechanically impactsand locally compresses metal piece 43 with a custom-made steel “die” inrapid fashion to form thin regions mechanically rather than chemically.Because stamping takes only seconds while chemical etching taketens-of-minutes to hours, stamping is therefore able to achieve a higherthroughput and lower manufacturing costs to form thin region 62 than theslower metal etching method described previously.

In the metal stamping process, the stamping machine's metal stamp has afeature having the same dimensions and located in the same places asshown by the opening 61 in photoresist layer 60. Photoresist layer 60 istherefore not required during metal stamping (except that during themaking of the stamp itself a photoresist layer may be used to define thestamp's protruding areas). When the hardened steel stamp strikes metalpiece 43, it locally compresses the softer metal piece 43 to the targetthickness of thin region 62 while leaving other portions at fullthickness.

Depending on the type of metal used for metal piece 43, the amount ofcompression can be substantial, squeezing the metal atoms into a volumedown to even 10% of the original thickness. Between the thick and thinportions of metal piece 43, the stamp creates a clean sheer verticalcut, even sharper than edges produced by etching. For stamping, it ispreferable that metal piece 43 be made of a uniform metal or alloy withno plated metal on its surface because, during stamping, plated metalmay crack or flake off. If stamping is used for manufacturing, any metalplating should be performed after the stamping is complete; the use of“pre-plated” metal should be avoided.

When the die pad in the completed package is to be exposed at the bottomof the package (referred to herein as an “exposed die pad”) a portion ofthe photoresist layer 60 is left within the opening 61. As a result, theetch process illustrated in FIG. 5B removes a portion of metal piece 43only in the areas where the cantilever segment of the lead and the gapbetween the lead and the die pad in the completed package are to belocated. The area in which the die pad is to be located is not etched.If a metal stamping process is used, the stamping die is correspondinglydesigned so that only the areas where the cantilever segment of the leadand the gap between the lead and the die pad are to be located arecompressed.

In FIG. 5C, metal piece 43 is coated with a photoresist layer 64, whichis optically patterned using photolithographic means to define openings65 and 66. A second etch is then performed on metal piece 43 throughopenings 65 and 66 to form openings 67 and thin regions 68 in metalpiece 43. Alternatively, the photoresist layer 64 may be silkscreenedthrough a stencil mask to define openings 65 and 66 in photoresist layer64. The second etch is performed by immersing the metal piece 43 in aheated acid bath of sulfuric or nitric acid, or other acids commonlyused to etch metal in semiconductor package manufacturing.

As shown, the openings 66 in photoresist layer 64 define the areas ofmetal piece 43 that will be subjected to the second metal etch so as toform the thin regions 68. Openings 65 define areas of the thin regions62 of metal piece 43 to be exposed to the second etch so as to form thegaps 67 in metal piece 43. The depth of the second etch process ischosen to thin metal piece 43 from its full thickness to a thicknesspreferably equal to 10% to 30% of the original thickness but generallyno thinner than 50 μm. In openings 65 in photoresist layer 64, thinregion 62, previously formed during the first etch, is exposed to thesecond etch, which completely removes all the metal in the thin regions62 to form gaps 67. Note that the opening 66 in photoresist layer 64 islaterally offset from the opening 61 in photoresist layer 60 so as toform the vertical column segment of the lead, as shown in FIG. 5D.

In an alternative embodiment, a hardened metal stamp is used to stampand compress a portion of metal piece 43 to form thin regions 68. Asdescribed previously, a metal stamp, typically made of steel or steelalloys, having protrusions that coincide with the openings 66 inphotoresist layer 64, compresses metal piece 43 to its final thickness68. Other portions of metal piece 43 remain unaffected and at theiroriginal thickness. As described previously, between thick and thinnedportions of metal piece 43 the stamp creates a clean sheer vertical cut.

In the alternative embodiment a second mechanical operation, metalpunching, is used after stamping to form openings 67 in the thin regions62 of the metal piece 43. Metal punching, like stamping, a method wellknown to those skilled in the art of metal working, utilizes precisionmachinery that impacts and locally cuts and removes portions of metalpiece 43 with a custom-made steel punch in rapid fashion. The punch,unlike a stamp, is designed to cut and completely remove material,whereas a stamp is generally used to compress and thin material, but notto remove it. Compared to chemical etching, mechanical punching takesonly seconds, rather than tens-of-minutes or hours, and is thereforeable to achieve higher throughput and lower manufacturing costs to formopenings 67 than metal etching.

If thin region 62 is sufficiently thin, a steel stamp having protrusionsthat coincide with both opening 66 and 65, may actually be used to formopenings 67 simultaneously, in the same process step, with thin regions68, Thus both the stamping and the punching operations are performed ina single step. While the combined operation may be theoreticallypossible, specialization of skills in machinists and the assignment ofdedicated equipment for stamping and punching may render commercialproduction of a one-step operation more specialized and therefore moreexpensive than performing stamping and punching separately andsequentially.

It should also be noted that the etching or stamping of metal piece 43to form thin regions 68 occurs on the opposite side of metal piece 43from the steps used to form thin regions 62. In practice, this involvesprocessing one side of the metal piece 43, then turning it over toprocess its other side. For clarity's sake however, the process stepsshown in FIG. 5A through FIG. 5G maintain the same orientation of metalpiece 43 as the final package orientation throughout the illustrations,showing some operations such as that of FIG. 5C on the topside of metalpiece 43 while illustrating other steps, e.g. in FIG. 5B, beingperformed on the backside of metal piece 43.

While the process of patterning and thinning metal piece 43 has beendescribed using masking and chemical etching processes, and in analternative embodiment using mechanical stamping and punching processes,the methods may be performed in combination. For example, chemicaletching may be used to form thin regions 62 while mechanical methods maybe used to form thin regions 68 and openings 67. As a practical matter,a photoresist layer such as layer 60 or 64 should not be present onmetal piece 43 whenever a mechanical operation is performed.

FIG. 5D illustrates the portions of metal piece 43 remaining after theprior metal thinning operations, including leads 43B and 43C and die pad43A, components of a leadframe 49 comprising the metal pieces as shownforming package 41 and other metal pieces forming other packages notshown in this cross section, temporarily held together by shared metalstrips forming the leadframe. A leadframe is the combination of themetal pieces forming the leads and die pad of multiple packages and themetal rails used to hold these metal pieces in place duringmanufacturing. After molding, the leads are separated from the leadframeto “singulate” the package from the lead frame's metal rails and fromthe other packages made on the same leadframe. Openings 67 separate diepad 43A from leads 43B and 43C. Other openings similar to openings 67,not shown in FIG. 5D, separate other leads similar to leads 43B and 43Cfrom die pads similar to die pad 43A. In this stage in the manufacturingflow, thin regions 68 still connect leads 43B and 43C with the leads ofadjacent packages, and the die pad 43A and other similar die pads arenot “floating” but instead are held in place by attachments to metalpiece 43 in the third dimension, i.e. beyond the plane of thecross-section at which FIG. 5D is taken. Thus, despite having thinregions 62 and 68 and openings 67, the leadframe 49 can still be handledas a single metal sheet.

FIG. 5E illustrates the leadframe 49 after die attach and wire bondingprocesses. Sequentially, a semiconductor die 44 is first attached to diepad 43A using solder or epoxy. The epoxy may be electrically conductive,using metal filling in the epoxy glue, or can be electricallyinsulating, as required. Wire bonding is then performed to form bondwires 45B and 45C between metal bond-pads located on the surface ofsemiconductor die 44 and cantilever segments of leads 43B and 43C. Thebond wires 45B and 45C may comprise gold, copper, aluminum or othermetal alloys. Other leads, not visible in FIG. 5E, may similarly beconnected through corresponding bond wires to other leads. Die pad 43Aand leads 43B and 43C, along with other leads (not shown in FIG. 5E),are held together during die attach and wire bonding operations inleadframe 43, which comprises many similar die pads and leads that werefabricated contemporaneously with die pad 43A and leads 43B and 43C.

Leadframe 49 is next molded with plastic using plastic injection moldingor mold transfer processes well known to those skilled in the art,forming a plastic body 42 shown in FIG. 5F. Except for the small ledge52, plastic body 42 covers the die pad 43A and the elevated horizontalportions of leads 43B and 43C, i.e. the portions not touching horizontalline 46, filling in both above and below the leadframe 49 to encapsulatedie 44. The ledge 52 comprising a slight protrusion of leads 43B and 43Cbeyond plastic body 42 occurs because the plastic body 42 must bemechanically aligned to the leadframe 49. Because any mechanical processmust accommodate some tolerance for misalignment, the lateral sides ofplastic body 42 are slightly stepped back from the outside edges of thevertical column segments of leads 43B and 43C. The ledges 52 are small,however, e.g. 0.1 mm in length, and therefore have a minimal impact onthe size of the package's footprint. In a preferred embodiment, plasticbody 42 does not overlap onto the thin regions 68.

Because the mold defining the location of the edge of plastic body 42 ismechanically aligned to leadframe 49, some tolerance for misalignmentresulting from natural statistical variation in manufacturing must beincluded in the design of the lateral dimension of ledge 52. To avoidthe case where the plastic body 42 overlaps onto thin regions 68 and inother cases forms a ledge 52, the design length of the ledges 52 shouldbe sufficient to accommodate variations in the dimensions of theleadframe 49 (whether formed by etching or stamping) and to accommodatevariations in the mold-to-leadframe alignment. This design length(tolerance) depends on the processing equipment and its maintenance andmay vary from 0.01 mm to 0.2 mm (preferably less than 0.1 mm).

In an alternative embodiment, plastic body 42 extends beyond thevertical outside edges of leads 43B and 43C, such that die 44 and leads43B and 43C are sealed entirely within plastic body 42 and plastic body42 overlaps slightly onto thin regions 68. But since this methodconsumes a larger dimension for the same die width, the maximum size ofdie 44 is adversely impacted compared to the embodiment shown in FIG.5F. If plastic body 42 is to consistently overlap onto the thin portion68 of leadframe 49, the design dimension of that overlap must besufficient to account for dimensional variations in leadframe 49 frometching or stamping and variations in the mold-to-leadframe alignment.

After plastic molding, the individual packages are separated, i.e.singulated, by cutting through the thin regions 68 with a precision saw.Dashed lines 51Y represent the locations of the edges of the saw bladeas it cuts through thin regions 68, leaving (except for the small ledges52) only feet 53B and 53C protruding beyond plastic body 42, as shown inthe cross-sectional view of FIG. 5G. Since plastic body 42 does notoverlap onto thin regions 68, the saw blade does not cut any portion ofplastic body 42, leaving feet 53B and 53C exposed for convenientsoldering. By contrast, in conventional leadless packages, the saw bladecuts through both the plastic body and the metal leads. With only asingle cutting operation to define the lateral extent of both plasticand metal, conventional leadless package construction is incapable ofproducing a package wherein the metal leads protrude beyond the plasticbody.

FIGS. 5F and 5G illustrate the saw blade cutting through leadframe 49 ina direction parallel to the dashed lines 51Y (the “y-direction”). In asecond pass, the same saw cuts leadframe 49 in a direction perpendicularto the dashed lines 51Y (the “x-direction”), completing the singulationprocess and separating every package in leadframe 49 from itsneighboring packages.

In the x-direction, the saw blade may cut through the leads, as shown inFIGS. 5F and 5G, or it may cut through the plastic body 42 and no leads,depending on the type of package being manufactured. In a “quad” leadpackage (QFF) which has leads on all four sides, the saw blade cuts thethin regions 68 of the leadframe 49 when cutting in the x-direction, ina manner similar to that shown in FIGS. 5F and 5G. In a dual-sided orDFF package, a package with leads only two sides, the saw blade cuts(with but one exception) only through the plastic body 42 when cuttingin the x-direction, since no leads are present on the sides of thepackages parallel to the x-direction.

The exception is for the so called “tie-bars”, which comprise thin metalextensions used to hold the die pad 43A and the other die pads in placeprior to molding. Unlike leads 43B and 43C whose feet 53B and 53C extendbeyond plastic body 42, the tie bars are cut flush with the plastic body42 and do not (and should not) protrude beyond the plastic as they mayinadvertently result in unwanted shorts during PCB assembly and wavesoldering. In a preferred embodiment, the tie bars are formed in anelevated position at the level of die pad 43A and the other die pads.

After singulation, the resulting footed package 41 shown in FIG. 5G,comprises die 44 mounted atop die pad 43A contained within plastic body42, with leads 43B and 43C that do not laterally extend beyond plasticbody 42 by any substantial amount except for feet 53B and 53C. Die 44 isconnected to leads 43B and 43C by corresponding wire bonds 45B and 45C.The length of feet 53B and 53C is defined by the location of saw cuts51Y in the y-direction (and for QFF packages by the perpendicular sawcuts in the x-direction). The length of ledges 52 is essentiallynegligible compared to the width of package 41 and to the length of thefeet 53B and 53C. The bottoms of feet 53B and 53C are coplanar with thebottom of plastic body 42. Die pad 43A is enclosed and surrounded byplastic body 42, except for the ends of the metal tie bars and any leadsthat may be optionally connected to die pad 43A, as described below.

Referring to FIG. 5G and to lead 43C in particular, it is apparent thata package of this invention may comprise a lead that is generallyZ-shaped when viewed in a vertical cross section. Lead 43C comprises avertical column segment 63C, a cantilever segment 73C and a foot 53C.Cantilever segment 73C extends horizontally inward towards the die padat the top of vertical column segment 63C, and foot 53C extendshorizontally outward at the bottom of vertical column segment 63C.Vertical column segment 63C forms right angles and sharp inside cornerswith cantilever segment 73C and with foot 53C. The bottom surface offoot 53C is coplanar with a bottom surface 42B of plastic body 42.Typically the top surface of the cantilever segment 73C is coplanar withthe top surface of the die pad 43A. In some embodiments the thickness ofthe cantilever segment 73C is equal to the thickness of the die pad 43A.

As shown, vertical column segment 63C has a height H_(C) and foot 53Chas a height H_(F) and length L_(F). The height He of the verticalcolumn segment 63C is equal to the original thickness of the metal piece43. In some embodiments, the height H_(F) of the foot 53C is no greaterthan 30% of the height H_(C) of the vertical column segment 63C. Anupper surface 53S of the foot 53C may be horizontal and parallel to abottom surface 53B of the foot 53C.

In the embodiment shown in FIG. 5G, vertical column segment 63C extendshorizontally beyond a side surface 42A of plastic body 42 to form ledge52. (Note that FIG. 5G is not drawn to scale.) Thus a vertical outsideedge 63E of vertical column segment 63C is not covered by plastic body42. In other embodiments, the side surface 42A of plastic body 42 ispositioned outward (to the right in FIG. 5G) beyond the vertical columnsegment 63C and covers a portion of the upper surface 53S of foot 53C.In such embodiments, there is no ledge 52 and the foot 53C protrudesoutward at the bottom of the side surface 42A of the plastic body 42.The package of this invention uniquely combines the characteristics of aleaded package, shown in FIGS. 1A and 1B, with those of a leadlesspackage, shown in FIGS. 2A and 2B. Thus the outside edge 63E of verticalcolumn segment 63C forms a vertical plane and is either covered byplastic body 42 or is located slightly outside the surface 42A ofplastic body 42. These features minimize the horizontal dimension ofpackage 41. Moreover, the bottom surface 53B of foot 53C is flat atleast from a location adjacent to the side surface 42A of plastic body42 (marked by the letter A) to an end 53E of foot 53C. (Note that thelocation of the side surface 42A in a third dimension outside the crosssection at which FIG. 5G is taken is shown as a dashed line. Thelocation is also shown in FIGS. 7A-7C). All or a portion of the uppersurface 53S of foot 53C is exposed. With this combination of features,the horizontal footprint of the package is minimized and yet solder caneasily flow onto the foot 53C and the package can be easily inspectedfor solder coverage and quality.

FIG. 6A illustrates a plan view of a leadframe 79 for an 8-lead DFFfooted package made in accordance with this invention prior to dieattach and wire bonding. The leadframe 79 comprises vertical and lateralbus bars 70 and 71 to provide mechanical rigidity to the structuresupporting a multiplicity of identical packages arranged in an array ofrows and columns. In this illustration, variations in the thickness ofleadframe 79 from etching or stamping are not shown except whereopenings have been formed in leadframe 79 in prior steps.

In FIG. 6A, a dashed line indicates a unit cell 73 defining one DFFpackage. Unit cell 73 is repeated multiple times within leadframe 79 toproduce multiple packages simultaneously. Within unit cell 73, the DFFpackage includes die pad 43A, leads 43B through 43I, and tie bars 72.For clarity's sake, the location of the semiconductor die and its bondwires has been omitted. Plastic body 42 is shown in dashed lines.

Plastic body 42 intersects and laterally overlaps only a portion ofleads 43B through 43H. Saw blade cut lines 51Y intersect leads 43Bthrough 43I but do not intersect plastic body 42, thereby defining thelength of the feet of leads 43B through 43I protruding beyond plasticbody 42. During singulation, saw cut 51Y permanently separates leads 43Bthrough 43H from metal bus bar 70.

Plastic body 42 entirely laterally encloses die pad 43A and tie bars 72.Thus, plastic body 42 forms a continuous vertical stripe overlapping allof the die pads in one row along the length of the leadframe. Duringsingulation, saw cut lines 51X transect plastic body 42 and tie bars 72,separating die pad 43A from bus bars 71 and completely removing thepackage within unit cell 73 from the other packages formed on leadframe79. Since saw cut 51X cuts through both plastic body 42 and metal tiebars 72, the ends of tie bars 72 after singulation are vertically flushwith the lateral extent of plastic body 42.

Adding detail to the prior figure, FIG. 6B illustrates both a plan viewand a correlated cross-sectional view of the aforementioned DFF packagethrough a section parallel to the x-direction. The cross-section shownis taken through the center of leads 43B and 43C, illustrating die 44,bond wires 43B and 43C, die pad 43A, leads 43B and 43C, package feet 53Band 53C and plastic body 42.

As shown, semiconductor die 44 having a lateral edge (collinear withdashed line 86) is positioned atop and laterally disposed within an edgeof die pad 43A (collinear with dashed line 85). The underlap of die pad43A beyond die 44, i.e. the distance between dashed lines 86 and 85, isbeneficial to insure reliable and reproducible electrical and thermalcontact between the die and the die pad. To insure that die 44 neverextends beyond the edge of die pad 43A, the overlap needs to accommodatestochastic dimensional variations in die pad 43 as well as misalignmentof die 44 to the leadframe 79 and die pad 43A. The underlap of die pad43A beyond die 44 may range from tens to hundreds of microns, but inpreferred embodiment should not exceed 100 microns or be lower than 20microns. While it is possible to for the underlap to be very small oreven zero, it is not advisable since any overhang of die 44 beyond theedge of die pad 43A can subject the die 44 to stress, cracking, andreliability failures.

The gap between the edge of die pad 43A and the inner edges of leads 43Bthrough 43I, i.e. the space between dashed line 85 and dashed line 84,is determined in the manufacturing of leadframe 49, and may differ foretched and stamped leadframes. A gap of 100 microns can be manufacturedwith low risk of electrical shorts between die pad 43A and leads 43Bthrough 43I.

As shown in the cross-sectional view of FIG. 6B, each of leads 43Bthrough 43I is in the shape of a “Z,” with a thin horizontal elevatedregion of the same thickness and at the same height as die pad 43A, athin horizontal “foot” coplanar with the bottom of the package and plane46, and a vertical column segment connecting the two horizontal regions.The vertical column segment located between dashed lines 82 and 81intersects and is partially embedded in plastic body 42, having aninside edge covered and enclosed by plastic body 42 and having anexposed outer edge.

The minimum length of the leads within plastic body 42, i.e. the lengthof leads 43B through 43I measured from dashed line 84 to dashed line 83,must be sufficient to accommodate the balls by which bond wires 45Bthrough 45I are mounted to leads 43B through 43I, while insuring theseballs are contained entirely within plastic body 42.

Dashed line 82 defines the transition from the thin cantilever segment(diving board) of leads 43B through 43I, to a thicker vertical columnsegment having a vertical length equal to the original thickness ofmetal piece 43, as shown in FIG. 5A. In a preferred embodiment this edgedefined by dashed line 82 is laterally contained within plastic body 42,with sufficient overlap to insure that stochastic variations in thedimensions of the leadframe 49 and in the alignment of leadframe 49 toplastic body 42 do not occasionally allow the vertical column segmentsof any of leads 43B through 43I to be completely uncovered. Minimumoverlap dimensions range from 100 microns to 20 microns.

Similarly, dashed line 81 defines outer edges of the vertical columnsegments of leads 43B through 43I and the transition of leads 43Bthrough 43I from a vertical column segment to a thin horizontal footregion coplanar with the bottom of the package, i.e. the portion ofleads 43B through 43I comprising feet 53B through 53I lying on plane 46.In a preferred embodiment these outer edges coincident with dashed line81 are located outside the edge of plastic body 42 with sufficient spacefor ledge 52 to insure that stochastic variations in the dimensions ofthe leadframe 49 and in the alignment of leadframe 49 to plastic body 42do not occasionally completely cover the outer edges of the verticalcolumn segments of any of the leads 43B through 43I. Minimum dimensionsof ledge 52 range from 100 microns to 20 microns.

The lateral length of feet 53B through 53I extending beyond plastic body42 is defined by saw blade cut 51Y, having minimum lengths of 100microns to 20 microns.

FIG. 6C illustrates both a plan view and a correlated cross-sectionalview of the aforementioned DFF package through a section parallel to they-direction. The cross-section shown is taken through the center of tiebars 72, illustrating die 44, die pad 43A, tie bars 72, and plastic body42. The plan view additionally illustrates bond wires 45B through 45I,leads 43B through 43I and plastic body 42. As shown, die 44 has edgescollinear with dashed line 86 and contained laterally within die pad 43Aand plastic body 42. Saw blade cut lines 51X transect tie bars 72 andplastic body 42, making the ends of tie bars 72 flush with the lateraledges of plastic body 42 at the ends of the DFF package, i.e. on thepackage edges where leads 43B through 43I are not located.

FIG. 6D provides a direct cross-sectional comparison of the DFF packagethrough a section parallel to the y-direction (leaded edges) and asection parallel to the x-direction (tie bar edges). As shown, die pad43A, tie bars 72 and the thin elevated horizontal portion of lead 43Care coplanar. Likewise the bottom of foot 53C and plastic body 42 arecoplanar with the bottom of the package and plane 46.

Saw cut line 51Y defines the length of foot 53C but does not intersectplastic body 42. The edge of plastic body 42 is stepped back from theoutside edge of the vertical column segment of lead 43C (denoted by thedashed line 81) by the length of ledge 52. Die 44 is laterally insetfrom the edge of die pad 43A and spaced from the thin elevatedhorizontal portion of lead 43C. Saw line 51X defines the edge of plasticbody 42 and tie bar 72. Edge 86 of die 44 is laterally inset frompackage edge defined by saw cut 51X.

A three-dimensional perspective drawing of an 8-lead DFF package 41 madein accordance with this invention is illustrated in FIG. 7A. Package 41comprises plastic body 42, tie bar 72, and visible leads 43C, 43E, 43Gand 43I, having corresponding feet 53C, 53E, 53G and 53I. The bottom ofthe plastic body 42, the bottoms of the vertical column segments of theleads 43B through 43I, and the bottoms of feet 53B through 53I arecoplanar to the bottom of the package and plane 46. As shown, the sidesof the vertical columns of leads 43 are exposed and not covered byplastic 42. The vertical portions of the leads protrude only slightlybeyond the side edges of plastic body 42 and are therefore not shown inthe drawing.

DFF Package with Exposed Die Pad

The aspect ratio of the package can be designed to be narrow or widerelative to its length. In FIG. 7B, an underside view of a narrow bodyDFF is shown comprising plastic body 42 and the bottom of footed leads43B through 43I. From the underside, there is no way to differentiatethe bottom of a lead's vertical column segment from its foot. FIG. 7Cillustrates a widebody option of the same DFF package made in accordancewith this invention. With a wider width and lower aspect ratio, anoptional exposed die pad 74 may be included to improve heat dissipationof the package. In a bottom view of another embodiment of this inventionshown in FIG. 7D, leads 43H and 43F are merged into exposed die pad 74to facilitate easier electrical connection to the die pad. Theadditional metal piece 91 bridges the gap between die pad 74 and lead43H to facilitate electrical and thermal conduction from the die pad tothe lead. Any number or combination of pins may be connected to theexposed die pad as desired simply by changing the leadframe design. Forexample, FIG. 7E illustrates four leads 43B, 43D, 43F and 43F connectedtogether to exposed die pad 74 and merged into a solid exposed heat tab92. No change in the plastic mold is required to vary the leadcombinations connected to the die pad, thereby minimizing the cost forimplementing custom pinout options. (Note: As used herein, the term“exposed die pad” refers to a die pad that extends downward and isexposed at the bottom surface of the package, thereby allowing directelectrical or thermal contact with a conductive trace or other featureof the printed circuit board (PCB) or other supporting structure onwhich the package is mounted.)

The mounting of the DFF package without an exposed die pad onto a PCBusing wave soldering is illustrated in the cross-sectional view of FIG.8A. As shown, a DFF package comprising plastic body 42, die pad 43A, andlead 43B with foot 53B is mounted atop PCB 27 having an upper surface46, insulating phenolic 28, internal metal traces 35, and exposed metaltraces 34. Dashed lines illustrate features internal to the DFF packagewhile solid lines denote features visible outside of plastic body 42.

After wave soldering, solder 30 coats the side and top of package leadfoot 53B, electrically and thermally connecting lead 43B to PCBconductor 34. Solder coating the horizontal surface of package foot 53Bis easily verified using optical machine or visual inspection. Somesolder may also wick its way onto the exposed vertical sidewall of lead43B but is not easily inspected using optical means. In wave soldering,little or no solder is present between the bottom of foot 53B and thetop of PCB conductor 34. All heat and current must therefore flow out offoot 53B, through solder 30 and into PCB conductor 34. Since die pad 43Ais entirely enclosed within plastic body 42 and since plastic exhibits arelatively poor thermal conductivity compared to metal, no direct meansexist for heat to flow from die pad 43A into PCB 27 unless one or moreleads are connected to die pad 43A.

In FIG. 8B, die pad 43A has been replaced by exposed die pad 74 actingas the die pad for mounting a semiconductor die (not shown) andproviding a low thermal resistance path to the backside of the DFFpackage. Unless however, some thermally conductive compound 37 isapplied atop PCB conductor 34 prior to mounting the package andperforming wave solder, the thermal performance of the package willexhibit only minimal improvements over that shown in FIG. 8A becausewithout conductive compound 37 heat cannot readily flow between exposeddie pad 74 and PCB conductive trace 34. Even with thermal conductivecompound 37, the thermal performance of the DFF package can be improvedby connecting one or more leads to the die pad as shown by thermal short93 illustrated in FIG. 8C. In this embodiment of the invention, thebackside of an 8-lead DFF package with an exposed die pad appears likethe package shown in FIG. 7C and does not require a special PCB layoutsince its pinout is identical to that required by the package shown inFIG. 8B. While an exposed die pad may be merged into one or more leads,the assembly of such designs differs from normal PCB assembly and fromthe large thermal mass of the die pad may require added heating durationor temperature to insure good electrical connection to the lead. It canalso increase lead inductance and adversely affect the high frequencyperformance of a package.

A DFF footed package 100 with an exposed die pad made in accordance withthis invention is illustrated in FIG. 9A. Package 100 includes plasticbody 42, die 44 mounted on exposed die pad 74, bond wires 45B and 45C,leads 43B and 43C with corresponding feet 53B and 53C. The length offeet 53B and 53C is defined by saw cut lines 51Y. Importantly, thebottom of exposed die pad is necessarily coplanar with the bottom offeet 53B and 53C since the leads and the exposed die pad are allconstructed from the same leadframe, formed simultaneously inmanufacturing.

A DFF package 110, shown in the cross-sectional view of FIG. 9B is avariation of package 100 with an exposed die pad 75 merged into a foot75C.

A DFF footed package 120 without an exposed die pad. made in accordancewith this invention is illustrated in FIG. 9C. Package 120 comprisesplastic body 42, die 44 mounted on die pad 43A, bond wires 45B and 45C,leads 43B and 43C with corresponding feet 53B and 53C. Die pad 43A ismerged into and electrically shorted to lead 43C by metal bridge 75.Optionally, down-bond 45C connects the topside ground connection of die44 to die pad 43A and lead 43C. Package 120 is expected to offer betterthermal resistance than package 41 of FIG. 4 but inferior to package 110of FIG. 9B.

A DFF footed package 130 with an exposed die pad made in accordance withthis invention is illustrated in FIG. 9D. Package 130 comprises plasticbody 42, die 44 mounted on exposed die pad 92, bond wires 45B and 45C,leads 43B and 43C with corresponding feet 53B and 53C. Die pad 92 ismerged into and electrically shorted to lead 43C by a metal bridge 75.Optionally, down-bond 45C connects the topside ground connection of die44 to exposed die pad 92 and lead 43C. While internal construction ofexposed die pad 92 and lead 53C are merged by metal bridge 75, theunderside of package 130 appears the same the package illustrated inFIG. 7C, having a gap 77 between exposed die pad 92 and foot 53C.

A DFF footed package 140 with an exposed die pad made in accordance withthis invention is illustrated in FIG. 9E. Package 140 comprises plasticbody 42, die 44 mounted on a T-shaped exposed die pad 76, bond wires 45Band 45C, leads 43B and 43C with corresponding feet 53B and 53C. With theT-shaped exposed die pad 76, a larger die size 44 can be used than inpackage 100 of FIG. 9A while maintaining a larger gap 77 between thebottom of exposed die pad 76 and feet 53B and 53C.

A DFF footed package 150 made in accordance with this invention isillustrated in FIG. 10. In package 150 plastic body 42 extends beyondthe vertical column segment of leads 43B and 43C and overlaps onto feet53B and 53C. As stated previously, this design is not preferable sinceit reduces the maximum size of die 44 for a given PCB area.

Four-Sided Footed (QFF) Package Variants

With minor changes, the methods for manufacturing a low profile footedpackage disclosed herein can be adapted to produce packages with leadson all four sides, i.e. quad flat footed or QFF packages. The steps ofthe manufacturing process flow for QFF packages are identical to thoseused to manufacture DFF packages, except for variations in the packagesize (and hence the mold) and in the leadframe and the location of thesaw blade cut lines relative to the leadframe. Otherwise, themanufacturing sequences for QFF and DFF packages are identical, makingit possible for a single manufacturing line to produce both productswith the same machinery.

FIG. 11A illustrates a plan view of a portion of a leadframe for an16-lead QFF footed package in accordance with this invention prior todie attach and wire bonding. Leadframe 50 comprises vertical and lateralbus bars 70 and 71 to provide mechanical rigidity to the structuresupporting a multiplicity of identical packages arranged in an array ofrows and columns. In this illustration, variations in the thickness ofleadframe 50 from etching or stamping are not shown except whereopenings in the leadframe have been formed.

In FIG. 11A, a dashed line indicates a unit cell 73, defining one QFFpackage. Unit cell 73 is repeated multiple times within leadframe 50 toproduce multiple packages simultaneously. Within unit cell 73, leadframe50 includes die pad 43A and leads 43B through 43Q. For clarity's sake,the location of the semiconductor die and its bond wires has beenomitted from this drawing.

Notably absent from the leadframe 50 are tie bars used to hold die pad43A in place prior to molding. Instead of employing tie bars to supportdie pad 43A during manufacturing operations, one or more of leads 43Bthrough 43Q is intentionally connected to the die pad 43A to offermechanical rigidity during die attach, wire bonding, and handling. In apreferred embodiment, these supporting leads are located on oppositesides of the package, such as illustrated in FIG. 11A by leads 43K and43P. Any die-pad connected lead is electrically shorted to the sameelectrical potential as die pad 43A.

Unless insulating epoxy is employed to attach the die to the die pad,the die pad's electrical potential is the same as the backside of thesemiconductor die mounted on it, which in most cases is ground potentialor the most negative IC voltage. Die-pad connected leads also moreefficiently carry heat from the die to the PCB than the other leads.This benefit in lower thermal resistance is inconsequential for packageswith exposed die pads, but otherwise it improves with each additionallead connected to the die pad. While a single die-pad connected lead mayalso be used to stabilize die pad 43A during processing, care must betaken to provide underside support to avoid “diving board” like bendingduring wire bonding.

Plastic body 42, shown as a dashed line, intersects and laterallyoverlaps only a portion of leads 43B through 43I. On the same sides ofplastic body 42, saw blade cut lines 51Y intersect leads 43B through 43Ibut do not intersect plastic body 42, thereby defining the length of thefeet of leads 43B through 43I protruding beyond plastic body 42. Duringsingulation, saw cut 51Y permanently separates leads 43B through 43Ifrom metal bus bar 70.

Similarly, plastic body 42 intersects and laterally overlaps only aportion of leads 43J through 43Q. On the same sides of plastic body 42,saw blade cut lines SIX intersect leads 43J through 43Q but do notintersect plastic body 42, thereby defining the length of the feet ofleads 43J through 43Q protruding beyond plastic body 42. Duringsingulation, saw cut 51X permanently separates leads 43J through 43Qfrom metal bus bar 71. Sawing of the QFF in the x-direction, where thesaw blade does not touch plastic 42 is in direct contrast to thesingulation of a DFF package, where the saw blade cuts through both theplastic and the tie bars. In this regard, sawing and singulation of theQFF package is uniform in both the x- and y-directions, whereas thesawing of a DFF package is not.

The aspect ratio of the QFF package can be varied to make the packagesquare or rectangular. Following the convention for prior art QFNpackages, the leads are normally spaced at even increments along eachpackage side. In the case of square aspect ratios, 3, 4, 5, and 6 leadsper side result in square packages having 12, 16, 20 and 24 leads, withone or two leads physically connected to the die pad. With two leadsconnected to the grounded die pad, a 16-pin package supports only 15distinct electrical signals, i.e., 14 independent leads and one groundconnected lead. If only one lead is ground connected then all thepackage leads can be biased at different potentials.

In FIG. 11B, an underside view of a square QFF package 55 is shown.Package 55 comprises plastic body 42 and the bottoms of the feet ofleads 43B through 43Q. From the underside, there is no way todifferentiate the bottom of a lead's vertical column segment from itsfoot. An optional exposed die pad 74 (shown by the dashed lines) may beincluded to improve heat dissipation of the package 55. If a designsimilar to that shown in FIG. 9D is used, from the underside leads 43Kand 43P, which are physically connected to the exposed die pad 74 appearidentical to the other leads. Any number or combination of pins may beconnected to the exposed die pad as desired simply by changing theleadframe design. No change in the plastic mold is required to vary thelead combinations connected to the die pad, thereby minimizing the costfor implementing custom pinout options.

A three-dimensional perspective drawing of 16-lead QFF package 55 isillustrated in FIG. 11C. Of the 16 leads, leads 43C, 43E, 43G, 43I arevisible on one edge of package 55, and leads 43J, 43L, 43N, and 43P arevisible on another edge of package 55. These leads have correspondingfeet 53C, 53E, 53G, 53I, 53J, 53L, 53N, and 53P. The bottom of theplastic body 42, the bottoms of the vertical column segments of theleads 43B through 43Q, and the bottoms of the feet 53B through 53Q arecoplanar and form the bottom of package 55. As shown, the sides of thevertical column segments of leads 43C, 43E, 43G, 43I, 43J, 43L, 43N and43P are exposed and not covered by plastic body 42. The vertical columnsegments of the leads 43C, 43E, 43G, 43I, 43J, 43L, 43N and 43P protrudeonly slightly beyond the side edges of plastic body 42, and theseprotrusions are therefore not shown in the drawing.

FIG. 12A illustrates a plan view of a leadframe 60 for a QFF packagehaving leads on three edges and a single “heat tab” lead on itsremaining edge, the heat tab comprising a single die-pad connected leadserving both as an electrical connection (for ground) and as alow-thermal resistance path out of the package and into the PCB on whichthe package is mounted. For clarity's sake, the location of thesemiconductor die and its bond wires has been omitted from FIG. 12A. Adashed line indicates a unit cell 73, defining one QFF package. Unitcell 73 is repeated multiple times within the leadframe 60 to producemultiple packages simultaneously. Within unit cell 73 are an exposed diepad 74 and leads 43C, 43E, 43G, 43I, and 43J through 43Q. On theremaining edge of the package, a single heat tab 92, shorted to die pad74, replaces the leads that might otherwise be present in this location.For example, heat tab 92 shown in the leadframe 60 of FIG. 12A replacesseparate leads 43B, 43D, 43F and 43G shown in FIG. 1A by filling in thegaps between the leads with metal, thereby merging the leads togetherinto a solid piece.

Like leadframe 50 shown in FIG. 11A, no tie bar is included in leadframe60. Instead, the die-pad connected heat tab 92 provides mechanicalrigidity during die attach, wire bonding, and handling without the needto support the die pad with other leads.

Plastic body 42 (shown as a dashed line) intersects and laterallyoverlaps only a portion of heat tab 92 and leads 43C, 43E, 43G and 43I.Saw blade cut lines 51Y intersect leads heat tab 92 and leads 43C, 43E,43G and 43I but do not intersect plastic body 42, thereby defining thelength of the feet of heat tab 92 and of the feet of leads 43C, 43E, 43Gand 43I protruding beyond plastic body 42. During singulation, the sawcut at line 51Y permanently separates heat tab 92 and leads 43C, 43E,43G and 43I from metal bus bar 70.

Similarly, plastic body 42 intersects and laterally overlaps only aportion of leads 43J through 43Q. Saw blade cut lines 51X intersectleads 43J through 43Q but do not intersect plastic body 42, therebydefining the length by which the feet of leads 43J through 43Q protrudebeyond plastic body 42. During singulation, saw cut 51X permanentlyseparates leads 43J through 43Q from metal bus bar 71. Sawing of the QFFin the x-direction where the saw blade does not touch plastic 42 is indirect contrast to the singulation of a DFF package, where the saw bladecuts through both the plastic and the tie bars. In this regard, sawingand singulation of the QFF package is uniform in both x- andy-directions, whereas the sawing of a DFF package is not.

The aspect ratio of the heat tab QFF package can be varied to make thepackage square or rectangular. Following the convention for prior artQFN packages, the leads are normally spaced at even increments alongeach package side. The heat tab may merge all on any combination ofadjacent leads on any package edge.

Heat flow out of the package into the PCB occurs vertically throughexposed die pad 74 and laterally through heat tab 92. Since heat tab 92is soldered onto the PCB on which the package is mounted, the thermalresistance in this heat conduction path is essentially constant. Heatconduction vertically from the exposed die pad 74 depends on the qualityof the thermal contact between the bottom of exposed die pad 74 and theconductor on the PCB that is located beneath the package. If a thermallyconductive compound is present between the bottom of exposed die pad 74and the PCB conductor, significant heat flow may occur through thispath. If however, no thermal compound is present, vertical heat flow isinhibited by any intervening air gap, and heat will flow into the PCBprimarily through the solder joints of heat tab 92.

In FIG. 12B, an underside view of a square heat tab QFF made inaccordance with this invention is shown comprising plastic body 42, heattab 92 and the bottom of footed leads 43 c, 43E, 43G, 43I and 43Jthrough 43Q. From the underside, there is no way to differentiate thebottom of a lead's vertical column segment from its foot. Exposed diepad 74 merged into heat tab 92 improves heat dissipation of the package.While the design shown merges four leads into a solid piece of metal toform heat tab 92, including optionally filling the gaps between theleads, any number or combination of pins may be connected to the exposeddie pad as desired simply by changing the leadframe design. No change inthe plastic mold is required to vary the lead combinations connected tothe die pad, thereby minimizing the cost for implementing custom pinoutoptions.

A heat tab QFF package made in accordance with this invention conductsheat through its heat tab, insuring a minimal power rating for thepackage without reliance on thermal conduction through its exposed diepad. Proper mounting of the heat tab QFF package onto a PCB using anintervening thermally conductive gel can further reduce the package'sthermal resistance, either allowing the package to be rated at a higherpower or reducing the junction temperature of the semiconductor at agiven power rating, thereby improving system reliability.

A three-dimensional perspective view of the 13-lead heat tab QFF package60 is illustrated in FIG. 12C. Shown are plastic body 42 with footedheat tab 92 and twelve other footed leads, where from the perspectiveshown only four leads 43J, 43L, 43N and 43P with corresponding feet 53J,53L, 53N and 53P are visible.

The bottom of the plastic body 42, along with the bottoms of thevertical column segments of the leads, feet and heat tab are coplanar tothe bottom of the package and plane 46. As shown, the sides of thevertical column segments of leads 43J, 43L, 43N, 43P and heat tab 92 areexposed and not covered by plastic body 42. The vertical column segmentsof the leads 433, 43L, 43N, 43P and heat tab 92 protrude only slightlybeyond the side edges of plastic body 42, and these protrusions aretherefore not shown in the drawing. Also illustrated in FIG. 12C, thelengths of the feet 53J, 53L, 53N and 53P are determined by saw bladecut line 51X. Similarly, the length of the foot on heat tab 92 isdetermined by saw blade cut line 51Y.

FIG. 13A illustrates a plan view of a leadframe 65 for a 9-lead heat tabQFF package made in accordance with this invention. Heat tabs 92A and92B are connected to die pad 74 and extend laterally beyond plastic body42 on two opposite edges of the package, while separate leads 43Jthrough 43Q, not shorted to die pad 74, are located on the other twopackage edges. Such a package offers superior power handling capabilityand low thermal resistance even if a thermally conductive compound isnot employed under the package when it is being mounted on a PCB. In analternative embodiment, an exposed die pad 74 may be replaced with an“isolated” die pad, i.e. fully enclosed by plastic body 42, withoutsignificantly degrading the package's thermal performance.

In another embodiment of the heat tab QFF package, the package is“stretched” beyond its square shape, i.e. with a length-to-width aspectratio greater than one, to increase the number of available packageleads. FIG. 13B illustrates a plan view of an alternative rectangularleadframe 70, wherein the number of leads located on the longer edges ofthe package transected by saw blade cut lines 51X are increased byadjusting the package dimensions as needed. In leadframe 70, the numberof leads on an edge has been doubled to eight per package edge,resulting in a 17-lead QFF package with dual heat tabs 92A and 92B.Leadframe 70 is illustrative. The number of leads can be increased toany number provided that the aspect ratio of the semiconductor diemounted on exposed die pad 74 does not become too severe and result indie cracking. In general, the length-to-width ratio of semiconductor dieshould not exceed 4 to 1 and preferably should not exceed 3 to 1. Forpractical reasons of optimum intra-die interconnections, in most casesdie aspect ratios do not exceed 2.5.

Another embodiment of a rectangular leadframe is shown in the plan viewof FIG. 13C. In leadframe 75, heat tabs and independent leads are bothprovided along each of the long edges of the package. Specifically, heattabs 92C and 92D are connected to exposed die pad 74, along withindependent leads 43J through 43Y. Heat tabs 92C and 92D and leads 43Jthrough 43Y are transected by saw blade cut lines 51X along the longedges of the package and separated during sawing from leadframe supportbars 71. Independent leads 43B through 43I are located on the shorteredges of the package transected by saw blade cut lines 51Y and separatedduring sawing from leadframe support bars 70. Dual heat tabs 92C and 92Deffectively conduct heat from die pad 74 while electrically constitutinga ground or die pad connection. Combined with electrically independentleads 43B through 43Y, the dual heat tab QFF design of FIG. 13Ccomprises a 25-lead footed package.

As described previously, a QFF package according to the invention mayuse leads or heat tabs rather than tie bars to hold the die pad in placeduring manufacturing and handling prior to molding. These leads shouldhold the die pad securely, without significantly bending or flexing,during die attach and wire bonding to avoid manufacturing andreliability problems with the assembled device. The reason that aminimum of one or two leads (rather than tie bars) must be reserved forinsuring mechanical stability during manufacture is that tie bars areincompatible with the manufacturing flow and leadframe design of a QFFpackage.

The attempted use of tie bars in a leadframe for a QFF packageunavoidably results in an unwanted protrusion of the tie bar portion ofthe leadframe beyond the package's plastic body, a protrusion thatinterferes with assembly, can lead to electrical shorts, and may duringhandling may cause cracking of the die cracking or plastic anddelamination of the plastic from other leads. This problem is unique tothe QFF and does not occur in a DFF package. As shown in FIG. 14A, inthe DFF package of FIG. 7A tie bar 72 exits the side of plastic body 42at a height equal to that of die pad 43A, i.e. elevated above the bottomplane 46 of the package, but tie bar 72 is cut “flush” with plastic body42 by the saw blade. Because the saw blade cuts both tie bar 72 andplastic 42 at the same time the tie bar 72 does not protrude beyond thesurface of the plastic body 42.

On the two leaded edges of the DFF, a situation similar to that of anyedge on a QFF package, however, the saw blade is pulled back from theedge of the plastic body 42 to accommodate formation of the feet 53C,53E, 53G, 53I of the leads 43C, 43E, 43G, 43I that extend beyond thesurface of the plastic body 42. In such a case, the presence of a tiebar at an edge of the package with footed leads will, without additionalprocessing steps, necessarily leave the tie bar protruding laterallybeyond the plastic body. The length of the protrusion will be equal tothe length of the feet. This problem is shown in the cross section ofFIG. 14B where a length of tie bar 72 determined by saw blade cut line51X (protrusion 99) extends beyond plastic body 42 by. Since the tie baris elevated above plane 46, the resulting “diving board” metalprotrusion can easily be bumped or bent during mechanical handlingresulting in package and die damage.

Since by no package edge with footed leads can accommodate a tie barwithout producing unwanted protrusion 99, then the QFF package ismutually incompatible with tie bars and must instead employ one or moreleads or heat tabs to stabilize the die pad during manufacturing. Addedsteps may be included to remove the tie bar protrusion from the packagebut since this step must necessarily occur after singulation, i.e.cutting the leads, the only steps to remove a metal protrusion wouldinvolve clipping or etching the unwanted component. Clipping or cuttingthe unwanted metal is problematic since there is no convenient way tohold the package during the process. Moreover the extra step could clackthe plastic molding and lead to quality and reliability failures.Etching could easily damage the other leads. Aside from thesecomplexities, the extra processing steps invariably add cost making theuse of a tie bar on a QFF package undesirable even if once or the meansdescribed or other means were devised to remove it.

Bump-on-Leadframe Fooled Package Variants

Footed packages such the DFF and the QFF packages made in accordancewith this invention are compatible with bond-wireless assembly methods.In bond-wireless assembly, bond wire interconnections are replaced bysolder balls or copper pillars formed on the die prior to assembly,generally while in wafer form, and subsequently used to attach the dieto the leadframe, providing both mechanical support and electricalconnections to the die. Because the dice are flipped-over to facilitatemounting on the leadframe, bond-wireless assembly methods are sometimesreferred to as “flip-chip” assembly.

The first step in bond-wireless assembly is to form the ball or pillaron the semiconductor die. Using methods well known to those skilled inthe art, bumps or balls are formed by dropping preformed silver solderballs through a stencil mask onto a heated wafer surface. Upon touchingexposed metal bonding pads, the solder balls melt, slightly adhering toopen bonding pads. The solder balls do not stick to any areas other thanexposed bonding pads, proving placement accuracy with micron precision.

Alternatively, contact can be facilitated using copper pillars. In thisprocess, also well known in the art and commercially available fromassembly houses, the topside of a silicon wafer is coated with a thinmetal sandwich comprising a bottom layer of a high temperaturerefractory metal such as tungsten or titanium, and a thin top layer ofcopper. The thin deposited metal sandwich is then masked and etchedusing photolithographic means, removing the metal everywhere exceptabove the bond pad areas. The wafer is then copper electroplated,growing columns of copper “pillars” only in locations where the thincopper base layer is present. During electroplating, the refractorymetal layer serves as a diffusion barrier keeping copper from diffusinginto the aluminum bond pads. After the pillar is formed, the copper isdipped in molten silver solder leaving a small droplet of solder atopeach pillar.

Whether bumped with solder balls or copper pillars, the “bumped” waferis then sawed into separate dice and mounted onto the leadframe using aflip-chip pick and place machine, i.e. where the die is flipped over sothe front side of the dice faces down as its aligned and mounted ontothe leadframe. A solder flow then melts the intervening solder securingthe die onto the leadframe both mechanically and electrically.

A cross-sectional view of a bond-wireless package in accordance with theinvention is illustrated in FIG. 15A. A bond-wireless footed package 160comprises die 44 having a front side attached to leadframe 43 throughsolder balls or pillars 165A through 165C where plastic body 42 enclosesdie 44 and solder balls 165A through 165C. Specifically solder ball 165Bconnects one bonding pad of die 44 to lead 43B and foot 53B, solder ball165C connects a different bonding pad of die 44 to lead 43C and foot 53Cand so on.

The ground or substrate connection of die 44 is not made from thebackside of the die but rather through a bonding pad on the front sideof die 44 connected to exposed die pad 74 through solder ball 165A.Other independent leads may also be electrically connected to thesubstrate or a ground pad of die 44, or as shown for a package 161 inFIG. 15B, lead 53C may be electrically shorted by metal bridge 92 toexposed die pad 74.

In bond-wireless packages 160 and 161, significant heat low from die 44through exposed die pad 74 requires a direct thermal path fromsemiconductor die 44 to the solder ball, i.e. a thermal via, through themetal interconnection layers within the surface of die 44, best achievedby using multiple solder balls for the substrate contact, with each ballvertically stacked atop contact and via openings filled with every layerof metal available in the process. Any intervening oxide will greatlyincrease the thermal resistance and degrade the power dissipatingcapability of the die in the bond-wireless package.

In some instances, for example in dice that contain devices withvertical current conduction, it may be necessary to electrically contactthe backside of die 44 even in bump-on-leadframe packages. One means tofacilitate backside contact of a die in a footed package assembled withbump-on-leadframe methods is illustrated in the cross section of FIG.16A, where the backside of die 44 is electrically connected to anexposed die pad 74A using one or more wire down-bonds 176. Die pad 74Acomprises a cantilevered shelf at its upper surface, allowing anadditional area for the attachment of wire down-bonds 176. Solder balls175 are shown as dotted lines indicating these balls are not in thecross section shown and do not necessarily contact exposed die pad 74A.

To bond onto the backside of die 44, a thick metal layer 178 is appliedto the backside of die 44 using evaporation or sputtering. The metallayer 178 may comprise a metal sandwich with a bottom layer comprising afirst metal such as tungsten or platinum, an intermediate layercomprising a second metal such as nickel, and a top layer comprising athird metal such as copper, silver, or gold. Ideally, if down bond wire176 is copper, the top layer of a sandwich-type metal layer 178 shouldalso be copper. If bond wire 176 is gold, the top layer of thesandwich-type metal layer 178 is preferably gold or silver.

FIG. 16B illustrates a plan view of a footed DFN package using abump-on-leadframe assembly with a backside down bond 176, wherebysemiconductor die 44 with solder balls 175B through 175I is mounted ontoa leadframe comprising footed leads 43B through 43I, tie bars 72, andplastic body 42. A down bond wire 176 connects the backside of die 44 toan exposed die pad 74, the down bond wire 176 being bonded to a widenedportion 177 of tie bar 72. The package is transected by saw blade cutlines 51X cutting plastic body 42 and tie bars 72 flush with oneanother. Saw blade cut line 51Y transects leads 43B through 43I but notthrough plastic body 42, thereby forming footed leads in accordance withthis invention.

FIG. 16C illustrates a plan view of another embodiment of thisinvention, comprising a footed heat tab QFF package usingbump-on-leadframe assembly and a backside down bond. Die 44 includessolder bumps or copper pillars 175 attaching the bond pads of die 44 tocorresponding package leads 43C, 43E, 43G, 43I and 43J through 43Q. Downbond wire 176 attaches topside thermal and electrical contacts on die 44to exposed die pad 74 and heat tab 92, providing both topside andbackside thermal and electrical conduction from semiconductor die 44.Die 44 and down bond wire 176 are contained within plastic body 42. Sawblade cuts lines 51X and 51Y transect leads 43C, 43E, 43G, 43I and 43Jthrough 43Q along with heat tab 92 forming the foot featurecharacteristic of QFF packages made in accordance with this invention.

I claim:
 1. A semiconductor package comprising: a plastic body, theplastic body having a side surface; a semiconductor die; and a leadpartially encased in the plastic body, the lead comprising a verticalcolumn segment and a foot, the foot projecting horizontally outward at abottom of the vertical column segment and protruding outward from abottom of the side surface of the plastic body, the vertical columnsegment forming fight angles and sharp corners with the foot.
 2. Thesemiconductor package of claim 1 wherein an outside edge of the verticalcolumn segment and a portion of the foot are covered by the plasticbody.
 3. The semiconductor package of claim 1 wherein the lead furthercomprises a cantilever segment, the cantilever segment extendinghorizontally inward at a top of the vertical column segment, thevertical column segment forming right angles and sharp corners with thecantilever segment.
 4. The semiconductor package of claim 3 furthercomprising a die pad, the die being mounted to the die pad and beingelectrically connected to the lead.
 5. The semiconductor package ofclaim 4 wherein a bottom surface of the die pad is exposed at a bottomof the package.
 6. The semiconductor package of claim 5 furthercomprising a heat tab, the heat tab comprising a horizontal extension ofthe die pad and having, a flat bottom surface coplanar with the bottomsurface of the die pad.
 7. The semiconductor package of claim 4 whereina top surface of the die pad is coplanar with a top surface of thecantilever segment of the lead.
 8. The semiconductor package of claim 4comprising a second lead, the second lead comprising a second cantileversegment, a second vertical column segment and a second foot, the die padbeing electrically connected to the second cantilever segment.
 9. Thesemiconductor package of claim 8 wherein a front side of the die iselectrically connected to the lead and the second lead and the die padby means of solder balls.
 10. The semiconductor package of claim 4wherein a bottom surface of the die pad is coplanar with a bottomsurface of the cantilever segment of the lead.
 11. The semiconductorpackage of claim 4 wherein the die is electrically connected to the leadwith a bond wire.
 12. The semiconductor package of claim 4 wherein thedie is flipped over such that a front side of the die is mounted to thedie pad.
 13. The semiconductor package of claim 12 wherein a front sideof the die is electrically connected to the lead and the die pad bymeans of solder balls or copper pillars.
 14. The semiconductor packageof claim 13 further comprising a down bond wire connecting a terminal ona front side of the die to the lead.
 15. The semiconductor package ofclaim 4 wherein the lead is shorted to the die pad by means of a bridge.16. A semiconductor package comprising: a plastic body, the plastic bodyhaving a side surface; and a lead partially encased in the plastic body,the lead comprising a vertical column segment and a foot, the footprotruding outward from a bottom of the vertical column segment, aninside surface of the vertical column segment being embedded in theplastic body, an outside surface of the vertical column segment and anupper surface of the foot being exposed.
 17. The semiconductor packageof claim 16 wherein, a top surface of the vertical column segmentprotrudes outward from the side surface of the plastic body so as toform a ledge.
 18. The semiconductor package of claim 16 furthercomprising a cantilever segment, the cantilever segment extendinghorizontally inward at a top of the vertical column segment.
 19. Thesemiconductor package of claim 16 further comprising a die pad and adie, the die being mounted to the die pad and being electricallyconnected to the lead.
 20. The semiconductor package of claim 19 whereina bottom surface of the die pad is exposed at a bottom of the package.21. The semiconductor package of claim 20 further comprising a heat tab,the heat tab comprising a horizontal extension of the die pad and havinga flat bottom surface coplanar with the bottom surface of the die pad.22. A semiconductor package comprising: a semiconductor die; a die pad,the die being mounted on the die pad; a plastic body, the die beingencased in the plastic body, the die pad being partially encased in theplastic body, a bottom surface of the die pad being exposed at a bottomof the package, the die pad extending horizontally beyond a side surfaceof the plastic body, a foot extending from a lateral surface of the diepad.
 23. The semiconductor package of claim 22 wherein the lateralsurface of the die pad and an upper surface of the foot are exposed.